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High-speed Imaging at the Nanoscale

Start Date: November 8, 2015 12:00 PM
End Date: November 8, 2015 1:00 PM

​CEMSE Dean's Distinguished Lecture Series

Professor Kamal Youcef-Toumi

Massachusetts Institute of Technology


Abstract: Atomic force microscopy is a powerful method used in various areas of nanoscience and nanoengineering. However, many new applications require both high-speed and high-precision imaging. The ability to image nanoscale features at high imaging rates opens many new opportunities and will change the way we explore the nanoscale world and enable new discoveries. The presentation covers first a few methods for “seeing” at the nanoscale. It also raises key issues, including the effects of resonances, coupled scanner dynamics, handling high data rates and real time control. Some of the essential contributions that made high speed imaging possible are presented. They include scanner design, instrumentation, real-time system identification, real time control methods, and cantilevers with integrated sensing and actuation. The presentation will conclude by reviewing some recent results, which include molecule-by-molecule DNA sequencing, characterization of textured surfaces for dust repellent coatings for solar panels, quality control for high density memory and nanoscale video imaging of etching and deposition processes. The developed technologies enabled an increase in the scan rate of more than 4000 lines per sec, data rates of 20 Mega samples/sec, and large scanning areas of 120µmx120µm.

Bio: Kamal Youcef-Toumi joined the MIT Mechanical Engineering Department in 1985. He earned his advanced degrees in mechanical engineering from MIT. Professor Youcef-Toumi's research has focused primarily on design, modeling, simulation, instrumentation and control theory. The applications have included manufacturing, robotics, automation, metrology and nano/biotechnology.